{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T11:25:15Z","timestamp":1780053915604,"version":"3.54.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/iolts.2017.8046214","type":"proceedings-article","created":{"date-parts":[[2017,9,29]],"date-time":"2017-09-29T16:57:02Z","timestamp":1506704222000},"page":"174-179","source":"Crossref","is-referenced-by-count":7,"title":["Analysis of radiation-induced cross domain errors in TMR architectures on SRAM-based FPGAs"],"prefix":"10.1109","author":[{"given":"Luca","family":"Sterpone","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luca","family":"Boragno","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860742"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSE.2012.81"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2008.5782736"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/NASNIT.2011.6111144"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICACCCT.2016.7831630"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2016.7753574"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2009.5012118"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2086075"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.82"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ReCoSoC.2015.7238082"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISWCS.2016.7600972"},{"key":"ref3","article-title":"Harsh Environments: Space Radiation Environment Effects and Mitigation","volume":"28","author":"maurer","year":"2008","journal-title":"Johns Hopkins APL Technical Digest"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2010.5550337"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ReCoSoC.2016.7533907"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910870"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2013.6548910"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2010.5448078"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2015.7231177"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.821411"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2016.7604690"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2635028"}],"event":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","location":"Thessaloniki, Greece","start":{"date-parts":[[2017,7,3]]},"end":{"date-parts":[[2017,7,5]]}},"container-title":["2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8030509\/8046164\/08046214.pdf?arnumber=8046214","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T17:28:43Z","timestamp":1509125323000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8046214\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/iolts.2017.8046214","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}