{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T15:08:09Z","timestamp":1725462489041},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/iolts.2017.8046218","type":"proceedings-article","created":{"date-parts":[[2017,9,29]],"date-time":"2017-09-29T16:57:02Z","timestamp":1506704222000},"page":"201-202","source":"Crossref","is-referenced-by-count":1,"title":["On-line testing of sensor networks: A case study"],"prefix":"10.1109","author":[{"given":"J. A.","family":"Miranda","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Vaskova","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Portela-Garcia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Garcia-Valderas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Lopez-Ongil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2015.7365695"},{"key":"ref3","article-title":"Wireless Network Sensor Design and Development for Secure Environments","author":"miranda","year":"2016","journal-title":"M T on Engineering of Electronic Systems and Applications"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SURV.2013.030713.00062"},{"key":"ref1","article-title":"A Survey on Fault Tolerance in Wireless Sensor Networks","author":"souza","year":"2007","journal-title":"Fakultät für Informatik Universität Karlsruhe"}],"event":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2017,7,3]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2017,7,5]]}},"container-title":["2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8030509\/8046164\/08046218.pdf?arnumber=8046218","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T17:45:09Z","timestamp":1509126309000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8046218\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/iolts.2017.8046218","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}