{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T16:58:30Z","timestamp":1729616310714,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/iolts.2017.8046230","type":"proceedings-article","created":{"date-parts":[[2017,9,29]],"date-time":"2017-09-29T16:57:02Z","timestamp":1506704222000},"page":"253-258","source":"Crossref","is-referenced-by-count":1,"title":["On-line monitoring of system health using on-chip SRAMs as a wearout sensor"],"prefix":"10.1109","author":[{"given":"Woongrae","family":"Kim","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Taizhi","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Linda","family":"Milor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2357756"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2015.10.002"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2520658"},{"key":"ref13","article-title":"Comprehensive reliablity-aware statistical timing analysis using a unified gate-delay model for microprocessors","author":"liu","year":"0","journal-title":"IEEE Trans Emerging Topics in Computing"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2513369"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378651"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IWASI.2013.6576097"},{"key":"ref17","first-page":"444","article-title":"The effect of a threshold failure time and bimodal behavior on the electromigraiton lifetime of copper interconnects","author":"filippi","year":"2009","journal-title":"Proc IEEE Int Reliability Physics Symp"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523624"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"118","DOI":"10.1109\/TVLSI.2014.2301458","article-title":"A method for improving power grid resilience to electromigration-caused via failures","volume":"23","author":"li","year":"2015","journal-title":"IEEE Trans VLSI"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2014.7035560"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2008.4771785"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040125"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"ref2","article-title":"Online timing analysis for wearout detection","author":"blome","year":"2006","journal-title":"Workshop on Architectural Reliability"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1080695.1070013"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2004.1311137"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784455"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"journal-title":"MiBench benchmark","year":"0","key":"ref21"},{"journal-title":"LEON3","year":"0","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.12"}],"event":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2017,7,3]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2017,7,5]]}},"container-title":["2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8030509\/8046164\/08046230.pdf?arnumber=8046230","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,3]],"date-time":"2019-10-03T23:42:17Z","timestamp":1570146137000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8046230\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/iolts.2017.8046230","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}