{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T16:30:50Z","timestamp":1783787450149,"version":"3.55.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/iolts.2017.8046237","type":"proceedings-article","created":{"date-parts":[[2017,9,29]],"date-time":"2017-09-29T20:57:02Z","timestamp":1506718622000},"page":"71-73","source":"Crossref","is-referenced-by-count":20,"title":["Advanced ECC solution for automotive SoCs"],"prefix":"10.1109","author":[{"given":"H.","family":"Shaheen","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"G.","family":"Boschi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"G.","family":"Harutyunyan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Y.","family":"Zorian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195976"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.16"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2011.5783109"},{"key":"ref5","first-page":"1","article-title":"Mission Profile Aware IC Design - A Case Study","author":"jerke","year":"2014","journal-title":"Design Automation and Test in Europe Conference and Exhibition (DATE)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"key":"ref7","article-title":"A BIST Implementation Framework for Supporting Field Testability and Confligurability in an Automotive SOC","author":"dutta","year":"2007","journal-title":"Workshop on Dependable and Secure Nanocomputing"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.38"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1147\/rd.144.0395"},{"key":"ref1","year":"2012","journal-title":"International Technology Roadmap for Semiconductors"}],"event":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","location":"Thessaloniki, Greece","start":{"date-parts":[[2017,7,3]]},"end":{"date-parts":[[2017,7,5]]}},"container-title":["2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8030509\/8046164\/08046237.pdf?arnumber=8046237","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T21:03:31Z","timestamp":1513199011000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8046237\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/iolts.2017.8046237","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}