{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T04:44:48Z","timestamp":1725597888973},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/iolts.2018.8474076","type":"proceedings-article","created":{"date-parts":[[2018,10,23]],"date-time":"2018-10-23T00:31:36Z","timestamp":1540254696000},"page":"39-40","source":"Crossref","is-referenced-by-count":3,"title":["A Low-Cost Soft Error Tolerant Read Circuit for Single\/Multi-Level Cross-Point RRAM Arrays"],"prefix":"10.1109","author":[{"given":"Hossein","family":"Bardareh","sequence":"first","affiliation":[]},{"given":"Amir M.","family":"Hajisadeghi","sequence":"additional","affiliation":[]},{"given":"Hamid R.","family":"Zarandi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2465164"},{"key":"ref3","first-page":"6","article-title":"3Dstackable crossbar resistive memory based on field assisted superlinear threshold (FAST) selector","author":"jo","year":"2014","journal-title":"International Electron Devices Meeting"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2017.03.014"},{"key":"ref5","first-page":"207","article-title":"Soft error analysis of MTJ-based logic-inmemory full adder: Threats and solution","author":"talafy","year":"2017","journal-title":"International Symposium on On-line Testing and Robust System Design"},{"key":"ref2","first-page":"1","article-title":"Designing a differential 3R-2bit RRAM cell for enhancing read margin in cross-point RRAM arrays","author":"nakhkash","year":"2017","journal-title":"Nordic Circuits and Systems Conference NORCHIP and International Symposiumof System-on-Chip"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"}],"event":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","start":{"date-parts":[[2018,7,2]]},"location":"Platja d'Aro","end":{"date-parts":[[2018,7,4]]}},"container-title":["2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8450543\/8474071\/08474076.pdf?arnumber=8474076","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T02:06:22Z","timestamp":1598234782000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8474076\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/iolts.2018.8474076","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}