{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T15:10:42Z","timestamp":1773414642608,"version":"3.50.1"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/iolts.2018.8474079","type":"proceedings-article","created":{"date-parts":[[2018,10,30]],"date-time":"2018-10-30T09:54:09Z","timestamp":1540893249000},"page":"119-122","source":"Crossref","is-referenced-by-count":5,"title":["Efficient Fault Injection for Embedded Systems: As Fast as Possible but as Accurate as Necessary"],"prefix":"10.1109","author":[{"given":"Petra R.","family":"Maier","sequence":"first","affiliation":[]},{"given":"Uzair","family":"Sharif","sequence":"additional","affiliation":[]},{"given":"Daniel","family":"Mueller-Gritschneder","sequence":"additional","affiliation":[]},{"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"The Extendable Translating Instruction Set Simulator (ETISS) interlinked with an MDA framework for fast RISC prototyping","author":"mueller-gritschneder","year":"2017","journal-title":"IEEE International Symposium on Rapid System Prototyping (RSP)"},{"key":"ref11","article-title":"ETISS-ML: A multilevel instruction set simulator with RTL-level fault injection support for the evaluation of cross-layer resiliency techniques","author":"mueller-gritschneder","year":"2018","journal-title":"Design Automation and Test in Europe (DATE)"},{"key":"ref12","article-title":"Fault injection at host-compiled level with static fault set reduction for SoC firmware robustness testing","author":"maier","year":"2016","journal-title":"Proc Int Conf Hardware\/Softw Codesign and Syst Synthesis (CODES+ISSS)"},{"key":"ref13","article-title":"Fault injection for test-driven development of robust SoC firmware","volume":"17","author":"maier","year":"2017","journal-title":"ACM Trans Embedded Comput Syst (TECS)"},{"key":"ref14","article-title":"Introduction to verilator","author":"snyder","year":"2009","journal-title":"veripool org"},{"key":"ref4","article-title":"A fast and flexible platform for fault injection and evaluation in Verilog-based simulations","author":"kammler","year":"2009","journal-title":"Proc of the Conference on Secure Software Integration and Reliability Improvement (SSIRI)"},{"key":"ref3","article-title":"Quantitative evaluation of soft error injection techniques for robust system design","author":"cho","year":"2013","journal-title":"Design Automation Conference (DAC)"},{"key":"ref6","article-title":"A virtual fault injection framework for reliabilityaware software development","author":"h\u00f6ller","year":"2015","journal-title":"Dependable Systems and Networks Workshops (DSN-W)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523621"},{"key":"ref8","article-title":"SystemC-based multi-level error injection for the evaluation of fault-tolerant systems","author":"mueller-gritschneder","year":"2014","journal-title":"Proc on Intl Symposium on Integrated Circuits (ISIC"},{"key":"ref7","article-title":"Embedded software reliability testing by unit-level fault injection","author":"maier","year":"2016","journal-title":"Asia South Pacific Design Automation Conf (ASP-DAC)"},{"key":"ref2","article-title":"ISO 26262","year":"2011","journal-title":"Road vehicles – Functional safety"},{"key":"ref1","article-title":"Reliability challenges for electric vehicles: From devices to architecture and systems software","author":"georgakos","year":"2013","journal-title":"Design Automation Conference (DAC)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/EDCC.2010.34"}],"event":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","location":"Platja d'Aro","start":{"date-parts":[[2018,7,2]]},"end":{"date-parts":[[2018,7,4]]}},"container-title":["2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8450543\/8474071\/08474079.pdf?arnumber=8474079","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T02:06:28Z","timestamp":1598234788000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8474079\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iolts.2018.8474079","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}