{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:23:01Z","timestamp":1730269381699,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/iolts.2018.8474275","type":"proceedings-article","created":{"date-parts":[[2018,10,23]],"date-time":"2018-10-23T00:31:36Z","timestamp":1540254696000},"page":"165-170","source":"Crossref","is-referenced-by-count":2,"title":["Soft error optimization of combinational circuit based on gate sizing and multi-objective particle swarm optimization algorithm"],"prefix":"10.1109","author":[{"given":"Xuebing","family":"Cao","sequence":"first","affiliation":[]},{"given":"Liyi","family":"Xiao","sequence":"additional","affiliation":[]},{"given":"Linzhe","family":"Li","sequence":"additional","affiliation":[]},{"given":"Jie","family":"Li","sequence":"additional","affiliation":[]},{"given":"Jiaqiang","family":"Li","sequence":"additional","affiliation":[]},{"given":"Jinxiang","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"21","article-title":"Single-event upset analysis and protection in high speed circuits","author":"hosseinabady","year":"2006","journal-title":"11th IEEE European Test Symposium"},{"journal-title":"Reliable Computer Systems Design and Evaluation","year":"1992","author":"siewiorek","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2009.29"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2034160"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860677"},{"year":"2014","key":"ref15"},{"year":"0","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2144622"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2330841"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2325063"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126614500911"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2422845"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2427372"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2459053"},{"key":"ref8","first-page":"863","article-title":"Low cost and highly reliable radiation hardened latch design in 65nm","volume":"55","author":"qi","year":"2015","journal-title":"ELSEVIER Microelectron J"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2016.2547187"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2260357"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2047907"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488829"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2440234"},{"key":"ref22","first-page":"1","article-title":"Reliability-driven don't care assignment for logic synthesis","author":"zukoski","year":"2011","journal-title":"Proc Design Automation and Test in Europe (DATE) Conf"},{"journal-title":"Introduction to Digital Logic Design","year":"1993","author":"hayes","key":"ref21"}],"event":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","start":{"date-parts":[[2018,7,2]]},"location":"Platja d'Aro","end":{"date-parts":[[2018,7,4]]}},"container-title":["2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8450543\/8474071\/08474275.pdf?arnumber=8474275","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T06:18:11Z","timestamp":1598249891000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8474275\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/iolts.2018.8474275","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}