{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T09:06:18Z","timestamp":1725699978245},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/iolts.2019.8854373","type":"proceedings-article","created":{"date-parts":[[2019,10,4]],"date-time":"2019-10-04T00:27:48Z","timestamp":1570148868000},"page":"27-32","source":"Crossref","is-referenced-by-count":2,"title":["Automated Die Inking through On-line Machine Learning"],"prefix":"10.1109","author":[{"given":"Constantinos","family":"Xanthopoulos","sequence":"first","affiliation":[]},{"given":"Arnold","family":"Neckermann","sequence":"additional","affiliation":[]},{"given":"Paulus","family":"List","sequence":"additional","affiliation":[]},{"given":"Klaus-Peter","family":"Tschernay","sequence":"additional","affiliation":[]},{"given":"Peter","family":"Sarson","sequence":"additional","affiliation":[]},{"given":"Yiorgos","family":"Makris","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(89)90049-0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2017.06.084"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-7908-2604-3_16"},{"key":"ref6","article-title":"Incremental and decremental support vector machine learning","author":"cauwenberghs","year":"2001","journal-title":"Advances in neural information processing systems"},{"key":"ref11","article-title":"Confidence Measures for Neural Network Classifiers","author":"zaragoza","year":"1998","journal-title":"Conference on Information Processing and Management of Uncertainty in Knowledge-Based Systems"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCVW.2009.5457447"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/5326.983933"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511809071"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242040"},{"key":"ref9","article-title":"Online Learning and Stochastic Approximations","author":"bottou","year":"1998","journal-title":"On-Line Learning in Neural Networks"},{"journal-title":"Guidelines for Part Average Testing","year":"2011","key":"ref1"}],"event":{"name":"2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)","start":{"date-parts":[[2019,7,1]]},"location":"Rhodes, Greece","end":{"date-parts":[[2019,7,3]]}},"container-title":["2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8846168\/8854369\/08854373.pdf?arnumber=8854373","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:50:52Z","timestamp":1658094652000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8854373\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iolts.2019.8854373","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}