{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:23:10Z","timestamp":1730269390163,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/iolts.2019.8854398","type":"proceedings-article","created":{"date-parts":[[2019,10,3]],"date-time":"2019-10-03T20:27:48Z","timestamp":1570134468000},"page":"287-292","source":"Crossref","is-referenced-by-count":1,"title":["iATPG: Instruction-level Automatic Test Program Generation for Vulnerabilities under DVFS attack"],"prefix":"10.1109","author":[{"given":"Kuozhong","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Junying","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Jing","family":"Ye","sequence":"additional","affiliation":[]},{"given":"Xiaochun","family":"Ye","sequence":"additional","affiliation":[]},{"given":"Da","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Dongrui","family":"Fan","sequence":"additional","affiliation":[]},{"given":"Huawei","family":"Li","sequence":"additional","affiliation":[]},{"given":"Xiaowei","family":"Li","sequence":"additional","affiliation":[]},{"given":"Zhimin","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Fault Injection using Crowbars on Embedded Systems","year":"2016","author":"o\u2019flynn","key":"ref10"},{"journal-title":"ARM White paper","article-title":"Security Technology - Building a Secure System using TrustZone Technology","year":"2009","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6993-4_2"},{"key":"ref13","article-title":"Microprocessor radiation effects","author":"guertin","year":"2015","journal-title":"Ionizing Radiation Effects in Electronics From Memories to Imagers"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488859"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2010.5491824"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1787275.1787342"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2009.33"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2015.09.011"},{"key":"ref4","article-title":"Analysis of dynamic voltage scaling for system level energy management","author":"dhiman","year":"2008","journal-title":"Conference on Power Aware Computing & Systems"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2015.2446205"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3218603.3218624"},{"key":"ref5","first-page":"1","author":"kaneko","year":"2017","journal-title":"KKT-condition inspired solution of DVFS with limited number of voltage levels"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2018.032271066"},{"key":"ref7","article-title":"CLKSCREW: exposing the perils of security-oblivious energy management","author":"tang","year":"2017","journal-title":"USENIX Security Symposium"},{"journal-title":"Computer Architecture A Quantitative Approach","year":"1990","author":"patterson","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2016.7482070"},{"key":"ref9","first-page":"221","author":"biham","year":"2008","journal-title":"Annual International Cryptology Conference"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2018.2796178"},{"journal-title":"Power Management in Mobile Devices","year":"2011","author":"shearer","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LCA.2016.2623628"},{"key":"ref24","first-page":"99","article-title":"Instruction set usage analysis for application-specific systems design","volume":"7","author":"mutigwe","year":"2013","journal-title":"Int J Inf Technol Comput Sci"},{"year":"2018","key":"ref23"}],"event":{"name":"2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)","start":{"date-parts":[[2019,7,1]]},"location":"Rhodes, Greece","end":{"date-parts":[[2019,7,3]]}},"container-title":["2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8846168\/8854369\/08854398.pdf?arnumber=8854398","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T17:51:35Z","timestamp":1658080295000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8854398\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/iolts.2019.8854398","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}