{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T13:56:38Z","timestamp":1725803798551},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/iolts.2019.8854403","type":"proceedings-article","created":{"date-parts":[[2019,10,4]],"date-time":"2019-10-04T00:27:48Z","timestamp":1570148868000},"page":"281-286","source":"Crossref","is-referenced-by-count":2,"title":["Analysis on Retention Time and Adaptive Refresh in Embedded DRAMs with Aging Benefits"],"prefix":"10.1109","author":[{"given":"Abdessamad","family":"Najdi","sequence":"first","affiliation":[]},{"given":"Daniele","family":"Rossi","sequence":"additional","affiliation":[]},{"given":"Vasileios","family":"Tenentes","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2519385"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2561206"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.2375204"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2165304"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241840"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2729399"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2305016"},{"journal-title":"Predictive Technology Model (PTM)","year":"0","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/WICT.2012.6409043"},{"key":"ref19","first-page":"29","article-title":"Retention time characterization and optimization of logic-compatible embedded DRAM cells","author":"do","year":"2012","journal-title":"2012 4th Asia Symposium on Quality Electronic Design (ASQED)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2417545"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.138"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2017.2667619"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-60402-2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3103\/S073527271603002X"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1147\/rd.492.0333"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2168729"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2128150"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007155"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2206685"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1950365.1950391"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2448079"}],"event":{"name":"2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)","start":{"date-parts":[[2019,7,1]]},"location":"Rhodes, Greece","end":{"date-parts":[[2019,7,3]]}},"container-title":["2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8846168\/8854369\/08854403.pdf?arnumber=8854403","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:50:52Z","timestamp":1658094652000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8854403\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/iolts.2019.8854403","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}