{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:23:12Z","timestamp":1730269392905,"version":"3.28.0"},"reference-count":50,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/iolts.2019.8854420","type":"proceedings-article","created":{"date-parts":[[2019,10,4]],"date-time":"2019-10-04T00:27:48Z","timestamp":1570148868000},"page":"135-138","source":"Crossref","is-referenced-by-count":1,"title":["Resiliency Demands on Next Generation Critical Embedded Systems"],"prefix":"10.1109","author":[{"given":"Jacob A.","family":"Abraham","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675150"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/0016-0032(56)90559-2"},{"key":"ref33","first-page":"263","article-title":"Babbages calculating engine","volume":"59","author":"lardner","year":"1834","journal-title":"Edinburgh Review"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/1315245.1315282"},{"key":"ref31","article-title":"Spectre attacks: Exploiting speculative execution","author":"kocher","year":"2018","journal-title":"arXiv preprint arXiv 1801 04720"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2017.3001256"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2015.43"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270315"},{"key":"ref28","first-page":"51","article-title":"Hardware trojan detection using path delay fingerprint","author":"jin","year":"2008","journal-title":"Hardware-Oriented Security and Trust 2008 HOST 2008 IEEE International Workshop on"},{"journal-title":"International Standard ISO","first-page":"26262","year":"2011","key":"ref27"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/12.4606"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1986.13528"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1102120.1102165"},{"key":"ref20","first-page":"3","article-title":"Why do computers stop and what can be done about it?","author":"gray","year":"1986","journal-title":"Symposium on Reliability in Distributed Software and Database Systems"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"147","DOI":"10.1002\/j.1538-7305.1950.tb00463.x","article-title":"Error detecting and error correcting codes","volume":"29","author":"hamming","year":"1950","journal-title":"Bell Labs Technical Journal"},{"key":"ref21","first-page":"13","article-title":"A classification of sql-injection attacks and countermeasures","volume":"1","author":"halfond","year":"2006","journal-title":"Proceedings of the IEEE International Symposium on Secure Software Engineering"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699215"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470686"},{"journal-title":"Computing architectures for autonomous vehicles","year":"2017","author":"huang","key":"ref26"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"518","DOI":"10.1109\/TC.1984.1676475","article-title":"Algorithm-based fault tolerance for matrix operations","volume":"100","author":"huang","year":"1984","journal-title":"Computers IEEE Transactions on"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.1996.495891"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/92.238422"},{"key":"ref11","first-page":"77","article-title":"Comprehensive experimental analyses of automotive attack surfaces","author":"checkoway","year":"2011","journal-title":"USENIX Security Symposium"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/12.54836"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2357756"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488859"},{"key":"ref14","first-page":"14","volume":"23","year":"2003","journal-title":"Trends and Challenges in VLSI Circuit Reliability"},{"journal-title":"Common Vulnerabilities and Exposures","year":"2018","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2003.10.003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1991.235340"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-85729-085-4"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052776"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2019.2903049"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223705"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"1587","DOI":"10.1109\/PROC.1969.7340","article-title":"electromigration failure modes in aluminum metallization for semiconductor devices","volume":"57","author":"black","year":"1969","journal-title":"Proceedings of the IEEE"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2016.7483361"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpdc.2008.12.002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2016.10"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_28"},{"journal-title":"Safety and security for automotive SoC design - arm","year":"2016","author":"turner","key":"ref46"},{"key":"ref45","first-page":"81","article-title":"Testing of semiconductor random access memories","author":"thatte","year":"1977","journal-title":"Proc Int Symp Fault-Tolerant Comput"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2013.18"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1515\/9781400882618-003"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/PST.2015.7232966"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743133"},{"key":"ref44","article-title":"A survey of hardware trojan taxonomy and detection","volume":"27","author":"tehranipoor","year":"2010","journal-title":"IEEE Design & Test of Computers"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/43.298042"}],"event":{"name":"2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)","start":{"date-parts":[[2019,7,1]]},"location":"Rhodes, Greece","end":{"date-parts":[[2019,7,3]]}},"container-title":["2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8846168\/8854369\/08854420.pdf?arnumber=8854420","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:50:52Z","timestamp":1658094652000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8854420\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":50,"URL":"https:\/\/doi.org\/10.1109\/iolts.2019.8854420","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}