{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,8]],"date-time":"2026-02-08T19:02:40Z","timestamp":1770577360093,"version":"3.49.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/iolts.2019.8854459","type":"proceedings-article","created":{"date-parts":[[2019,10,4]],"date-time":"2019-10-04T00:27:48Z","timestamp":1570148868000},"page":"58-59","source":"Crossref","is-referenced-by-count":11,"title":["Fault Modeling and Simulation of Memristor based Gas Sensors"],"prefix":"10.1109","author":[{"given":"Saurabh","family":"Khandelwal","sequence":"first","affiliation":[]},{"given":"Anu","family":"Bala","sequence":"additional","affiliation":[]},{"given":"Vishal","family":"Gupta","sequence":"additional","affiliation":[]},{"given":"Marco","family":"Ottavi","sequence":"additional","affiliation":[]},{"given":"Eugenio","family":"Martinelli","sequence":"additional","affiliation":[]},{"given":"Abusaleh","family":"Jabir","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2215714"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"1285","DOI":"10.1007\/s10825-018-1176-y","article-title":"Efficient Sensing Approaches for High-Density Memristor Sensor Array","volume":"17","author":"adedotun","year":"2018","journal-title":"J Comput Electron"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.2009.0553"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2433536"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569900"},{"key":"ref7","article-title":"Surface Contaminants","year":"0","journal-title":"Corrosionpedia com"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10832-009-9583-x"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"80","DOI":"10.1038\/nature06932","article-title":"The Missing Memristor Found","volume":"453","author":"strukov","year":"2008","journal-title":"Nature"}],"event":{"name":"2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)","location":"Rhodes, Greece","start":{"date-parts":[[2019,7,1]]},"end":{"date-parts":[[2019,7,3]]}},"container-title":["2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8846168\/8854369\/08854459.pdf?arnumber=8854459","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:51:34Z","timestamp":1658094694000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8854459\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iolts.2019.8854459","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}