{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,24]],"date-time":"2025-07-24T11:30:28Z","timestamp":1753356628523},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,7]]},"DOI":"10.1109\/iolts50870.2020.9159715","type":"proceedings-article","created":{"date-parts":[[2020,8,5]],"date-time":"2020-08-05T17:17:01Z","timestamp":1596647821000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Representing Gate-Level SET Faults by Multiple SEU Faults at RTL"],"prefix":"10.1109","author":[{"given":"Ahmet Cagri","family":"Bagbaba","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maksim","family":"Jenihhin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raimund","family":"Ubar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Sauer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.47"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147104"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061131"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2015.7373147"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ATS47505.2019.00024"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2019.8854449"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/11757283_4"},{"journal-title":"Multiway decision graphs for automated hardware verification","year":"1996","author":"corella","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/NORCHIP.2019.8906932"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"journal-title":"A Survey on Fault Injection Techniques","year":"2003","author":"ziade","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2017.15"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035347"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2014.33"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2014.6850666"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2014.219"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1078"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2016.7753547"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2011.76"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"}],"event":{"name":"2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2020,7,13]]},"location":"Napoli, Italy","end":{"date-parts":[[2020,7,15]]}},"container-title":["2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9151097\/9159702\/09159715.pdf?arnumber=9159715","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:51:38Z","timestamp":1656438698000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9159715\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iolts50870.2020.9159715","relation":{},"subject":[],"published":{"date-parts":[[2020,7]]}}}