{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T15:32:02Z","timestamp":1725723122981},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,7]]},"DOI":"10.1109\/iolts50870.2020.9159746","type":"proceedings-article","created":{"date-parts":[[2020,8,5]],"date-time":"2020-08-05T17:17:01Z","timestamp":1596647821000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Error Modeling for Image Processing Filters accelerated onto SRAM-based FPGAs"],"prefix":"10.1109","author":[{"given":"Cristiana","family":"Bolchini","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luca","family":"Cassano","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrea","family":"Mazzeo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Miele","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/AHS.2019.000-5"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/FPT.2018.00037"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/ISSREW.2018.00024"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1145\/3126908.3126964"},{"year":"2018","journal-title":"Bing Maps APIs","key":"ref14"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/JSTSP.2020.2966864"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/MNET.2019.1900120"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1145\/2893356"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/AHS.2018.8541485"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/DSD.2018.00050"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TC.2020.2965518"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TC.2013.80"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TPDS.2018.2812853"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/DFT.2019.8875362"}],"event":{"name":"2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2020,7,13]]},"location":"Napoli, Italy","end":{"date-parts":[[2020,7,15]]}},"container-title":["2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9151097\/9159702\/09159746.pdf?arnumber=9159746","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:51:39Z","timestamp":1656438699000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9159746\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iolts50870.2020.9159746","relation":{},"subject":[],"published":{"date-parts":[[2020,7]]}}}