{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T16:19:26Z","timestamp":1759335566933,"version":"3.37.3"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T00:00:00Z","timestamp":1662940800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T00:00:00Z","timestamp":1662940800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,12]]},"DOI":"10.1109\/iolts56730.2022.9897224","type":"proceedings-article","created":{"date-parts":[[2022,9,27]],"date-time":"2022-09-27T19:57:10Z","timestamp":1664308630000},"page":"1-5","source":"Crossref","is-referenced-by-count":10,"title":["All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage"],"prefix":"10.1109","author":[{"given":"Michael","family":"Sekyere","sequence":"first","affiliation":[{"name":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marampally","family":"Saikiran","sequence":"additional","affiliation":[{"name":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Degang","family":"Chen","sequence":"additional","affiliation":[{"name":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS52500.2021.9794271"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131577"},{"key":"ref12","first-page":"1","article-title":"Robust Built-In Defect-Detection for Low Drop-Out Regulators Using Digital Mismatch Injection","author":"saikiran","year":"2022","journal-title":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510896"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.644035"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICSPCom.2015.7150685"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594148"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1999.777264"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/SSD.2018.8570527"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44778.2020.9325226"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197675"},{"key":"ref3","first-page":"17","article-title":"Production test challenges for highly integrated mobile phone SOCs — A case study","author":"poehl","year":"2010","journal-title":"2010 15th IEEE European Test Symposium"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.21830"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2775632"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763065"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847817"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2003.1250837"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805620"},{"key":"ref9","first-page":"5","author":"al-assadi","year":"2005","journal-title":"Issues in Testing Analog Devices"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.1999.804430"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-ASIA.2017.8097102"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1587\/elex.15.20180175"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1049\/el:19940123"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1998.655953"}],"event":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2022,9,12]]},"location":"Torino, Italy","end":{"date-parts":[[2022,9,14]]}},"container-title":["2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9897157\/9897171\/09897224.pdf?arnumber=9897224","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,10,14]],"date-time":"2022-10-14T20:54:40Z","timestamp":1665780880000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9897224\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,12]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/iolts56730.2022.9897224","relation":{},"subject":[],"published":{"date-parts":[[2022,9,12]]}}}