{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T16:45:13Z","timestamp":1776530713253,"version":"3.51.2"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T00:00:00Z","timestamp":1662940800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T00:00:00Z","timestamp":1662940800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,12]]},"DOI":"10.1109\/iolts56730.2022.9897262","type":"proceedings-article","created":{"date-parts":[[2022,9,27]],"date-time":"2022-09-27T19:57:10Z","timestamp":1664308630000},"page":"1-7","source":"Crossref","is-referenced-by-count":4,"title":["Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices"],"prefix":"10.1109","author":[{"given":"Andrea","family":"Portaluri","sequence":"first","affiliation":[{"name":"Dipartimento di Automatica e Informatica,Politecnico di Torino,Turin,Italy"}]},{"given":"Sarah","family":"Azimi","sequence":"additional","affiliation":[{"name":"Dipartimento di Automatica e Informatica,Politecnico di Torino,Turin,Italy"}]},{"given":"Corrado","family":"De Sio","sequence":"additional","affiliation":[{"name":"Dipartimento di Automatica e Informatica,Politecnico di Torino,Turin,Italy"}]},{"given":"Luca","family":"Sterpone","sequence":"additional","affiliation":[{"name":"Dipartimento di Automatica e Informatica,Politecnico di Torino,Turin,Italy"}]},{"given":"David Merodio","family":"Codinachs","sequence":"additional","affiliation":[{"name":"European Space Research and Technology Centre,European Space Agency (ESA),Noordwijk,The Netherland"}]}],"member":"263","event":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","location":"Torino, Italy","start":{"date-parts":[[2022,9,12]]},"end":{"date-parts":[[2022,9,14]]}},"container-title":["2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9897157\/9897171\/09897262.pdf?arnumber=9897262","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,10,14]],"date-time":"2022-10-14T20:54:43Z","timestamp":1665780883000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9897262\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,12]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/iolts56730.2022.9897262","relation":{},"subject":[],"published":{"date-parts":[[2022,9,12]]}}}