{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T16:42:36Z","timestamp":1776530556914,"version":"3.51.2"},"reference-count":34,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T00:00:00Z","timestamp":1662940800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T00:00:00Z","timestamp":1662940800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,12]]},"DOI":"10.1109\/iolts56730.2022.9897448","type":"proceedings-article","created":{"date-parts":[[2022,9,27]],"date-time":"2022-09-27T19:57:10Z","timestamp":1664308630000},"page":"1-7","source":"Crossref","is-referenced-by-count":7,"title":["Experimental evaluation of neutron-induced errors on a multicore RISC-V platform"],"prefix":"10.1109","author":[{"given":"Fernando Fernandes","family":"Dos Santos","sequence":"first","affiliation":[{"name":"Univ. Rennes,INRIA,Rennes,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Angeliki","family":"Kritikakou","sequence":"additional","affiliation":[{"name":"Univ. Rennes,INRIA,Rennes,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Olivier","family":"Sentieys","sequence":"additional","affiliation":[{"name":"Univ. Rennes,INRIA,Rennes,France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3126908.3126964"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2014.49"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.21"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1021\/1\/012037"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2878387"},{"key":"ref10","first-page":"1","article-title":"Comparison of parallel implementation strategies in gpu-accelerated system-on-chip under proton irradiation","author":"badia","year":"2021","journal-title":"IEEE Transactions on Nuclear Science"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3098845"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860742"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2705150"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3142092"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/SpaceComp.2019.00008"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.2995729"},{"key":"ref17","first-page":"1","article-title":"Characterization of a risc-v system-onchip under neutron radiation","author":"santos","year":"2021","journal-title":"2021 16th International Conference on Design Technology of Integrated Systems in Nanoscale Era (DTIS)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ASAP.2018.8445101"},{"key":"ref19","first-page":"1","article-title":"Soft error effects on arm microprocessors: Early estimations vs. chip measurements","author":"bodmann","year":"2021","journal-title":"IEEE Transactions on Computers"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2302432"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2019.8875345"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3141341"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS48698.2020.9081185"},{"key":"ref6","first-page":"86","article-title":"Time redundancy based soft-error tolerance to rescue nanometer technologies","author":"nicolaidis","year":"1999","journal-title":"VLSI Test Symposium 1999 Proceedings 17th IEEE"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/FTCSH.1995.532603"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715107"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3528416.3530869"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2444855"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCASIT50869.2020.9368845"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378282"},{"key":"ref22","first-page":"641","author":"sullivan","year":"2021","journal-title":"Characterizing And Mitigating Soft Errors in GPU DRAM"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2638081"},{"key":"ref24","article-title":"Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices","year":"2006","journal-title":"JEDEC Standard Tech Rep JESD89A"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-W50199.2020.00020"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2017.7969976"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2921767"}],"event":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","location":"Torino, Italy","start":{"date-parts":[[2022,9,12]]},"end":{"date-parts":[[2022,9,14]]}},"container-title":["2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9897157\/9897171\/09897448.pdf?arnumber=9897448","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,10,14]],"date-time":"2022-10-14T20:54:35Z","timestamp":1665780875000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9897448\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,12]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/iolts56730.2022.9897448","relation":{},"subject":[],"published":{"date-parts":[[2022,9,12]]}}}