{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:42:26Z","timestamp":1740102146713,"version":"3.37.3"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,7,3]],"date-time":"2023-07-03T00:00:00Z","timestamp":1688342400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,3]],"date-time":"2023-07-03T00:00:00Z","timestamp":1688342400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003593","name":"CNPq (National Science Foundation, Brazil)","doi-asserted-by":"publisher","award":["310124\/2019-0 (PQ)"],"award-info":[{"award-number":["310124\/2019-0 (PQ)"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,7,3]]},"DOI":"10.1109\/iolts59296.2023.10224874","type":"proceedings-article","created":{"date-parts":[[2023,8,28]],"date-time":"2023-08-28T17:50:13Z","timestamp":1693245013000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Artificial Neural Network Accelerator for Classification of In-Field Conducted Noise in Integrated Circuits' DC Power Lines"],"prefix":"10.1109","author":[{"given":"Fabian","family":"Vargas","sequence":"first","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Germany"}]},{"given":"Douglas","family":"Borba","sequence":"additional","affiliation":[{"name":"LABELO,Specialized Electric-Electronic Laboratories,Brazil"}]},{"given":"Juliano D'ornelas","family":"Benfica","sequence":"additional","affiliation":[{"name":"Independent Consulting Research,Brazil"}]},{"given":"Rizwan Tariq","family":"Syed","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Germany"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1080\/01431160701352154"},{"year":"2016","author":"goodfellow","journal-title":"Deep Learning (Adaptive Computation and Machine Learning series)","key":"ref12"},{"key":"ref15","first-page":"1","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"2015","journal-title":"3rd Int Conf Learn Represent ICLR 2015 - Conf Track Proc"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/RTEICT42901.2018.9012614"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1145\/2951913.2976746"},{"year":"2000","journal-title":"IEC 61000–4-29 Electromagnetic compatibility (EMC) - Part 4-29 Testing and measurement techniques - Voltage dips short interruptions and voltage variations on d c input power port immunity tests","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/EDAPS.2017.8276967"},{"year":"1999","author":"crouch","journal-title":"Design-for-test for Digital IC's and Embedded Core Systems","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1088\/2632-2153\/ac0ea1"},{"year":"0","journal-title":"GitHub com","key":"ref16"},{"year":"2012","journal-title":"IEC 61000–4-4 Electromagnetic Compatibility (EMC) - Part 4-4 Testing and Measurement Techniques - Electrical Fast transient\/Burst Immunity Test","key":"ref8"},{"year":"0","journal-title":"IEC 61000–4-2 Electromagnetic compatibility (EMC) - Part 4-2 Testing and measurement techniques - Electrostatic discharge immunity test","first-page":"2000","key":"ref7"},{"year":"2005","journal-title":"IEC 61000–4-5 Electromagnetic Compatibility (EMC) - Part 4-5 Testing and Measurement Techniques - Surge Immunity Test","key":"ref9"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TNS.2016.2523458"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TEMC.2018.2821712"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.microrel.2020.113884"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.microrel.2019.06.033"}],"event":{"name":"2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2023,7,3]]},"location":"Crete, Greece","end":{"date-parts":[[2023,7,5]]}},"container-title":["2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10224820\/10224858\/10224874.pdf?arnumber=10224874","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,18]],"date-time":"2023-09-18T17:43:21Z","timestamp":1695059001000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10224874\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,3]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iolts59296.2023.10224874","relation":{},"subject":[],"published":{"date-parts":[[2023,7,3]]}}}