{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T18:16:41Z","timestamp":1755800201011,"version":"3.44.0"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T00:00:00Z","timestamp":1751846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T00:00:00Z","timestamp":1751846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,7]]},"DOI":"10.1109\/iolts65288.2025.11116913","type":"proceedings-article","created":{"date-parts":[[2025,8,19]],"date-time":"2025-08-19T18:07:28Z","timestamp":1755626848000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Bloom Filters for Soft Error Detection: Neutron and Fault Injection Validation"],"prefix":"10.1109","author":[{"given":"Elijah Seth","family":"Cishugi","sequence":"first","affiliation":[{"name":"University of Twente,The Netherlands"}]},{"given":"Tijmen T.","family":"Smit","sequence":"additional","affiliation":[{"name":"University of Twente,The Netherlands"}]},{"given":"Bruno","family":"Forlin","sequence":"additional","affiliation":[{"name":"University of Twente,The Netherlands"}]},{"given":"Carlo","family":"Cazzaniga","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory,UK"}]},{"given":"Kuan-Hsun","family":"Chen","sequence":"additional","affiliation":[{"name":"University of Twente,The Netherlands"}]},{"given":"Marco","family":"Ottavi","sequence":"additional","affiliation":[{"name":"University of Twente,The Netherlands"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"issue":"1","key":"ref3","doi-asserted-by":"crossref","first-page":"68","DOI":"10.1016\/S0019-9958(60)90287-4","article-title":"On a class of error correcting binary group codes","volume":"3","author":"Bose","year":"1960","journal-title":"Information and Control"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1147\/rd.144.0395"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.850125"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/362686.362692"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/INFCOM.2012.6195563"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/11841036_61"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"485","DOI":"10.1080\/15427951.2004.10129096","article-title":"Network applications of bloom filters: A survey","volume":"1","author":"Broder","year":"2004","journal-title":"Internet Mathematics"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2006.320022"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.41"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2311234"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2012.56"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.300"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2017.8244458"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFT56152.2022.9962340"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS60994.2024.10616084"},{"key":"ref18","article-title":"Lookup","volume-title":"Burtleburtle.net","author":"Jenkins","year":"2006"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2015.7336722"},{"key":"ref20","article-title":"Exploring coremark a benchmark maximizing simplicity and efficacy","author":"Gal-On","year":"2012","journal-title":"The Embedded Microprocessor Benchmark Consortium"},{"volume-title":"Igloo2 and smartfusion2 65nm commercial flash fpgas: Interim summary of radiation test results","year":"2014","author":"Inc","key":"ref21"},{"volume-title":"Science and Technology Facility Council\/ ISIS Neutron and Muon Source","key":"ref22","article-title":"Chipir"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DFT63277.2024.10753564"},{"key":"ref24","article-title":"Microchip smartdebug"}],"event":{"name":"2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2025,7,7]]},"location":"Ischia, Italy","end":{"date-parts":[[2025,7,9]]}},"container-title":["2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11115077\/11116814\/11116913.pdf?arnumber=11116913","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T07:17:17Z","timestamp":1755674237000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11116913\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,7]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/iolts65288.2025.11116913","relation":{},"subject":[],"published":{"date-parts":[[2025,7,7]]}}}