{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,7]],"date-time":"2026-05-07T15:53:16Z","timestamp":1778169196272,"version":"3.51.4"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T00:00:00Z","timestamp":1751846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T00:00:00Z","timestamp":1751846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,7]]},"DOI":"10.1109\/iolts65288.2025.11117065","type":"proceedings-article","created":{"date-parts":[[2025,8,19]],"date-time":"2025-08-19T18:07:28Z","timestamp":1755626848000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["ReDiM: An Efficient Strategy for Read Disturb Mitigation in RRAM-Based Accelerators"],"prefix":"10.1109","author":[{"given":"Jianan","family":"Wen","sequence":"first","affiliation":[{"name":"IHP - Leibniz-Institut f&#x00FC;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrea","family":"Baroni","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut f&#x00FC;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alberto","family":"Mistroni","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut f&#x00FC;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eduardo","family":"Perez","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut f&#x00FC;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cristian","family":"Zambelli","sequence":"additional","affiliation":[{"name":"Universit&#x00E0; degli Studi di Ferrara,Dip. di Ingegneria,Ferrara,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Wenger","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut f&#x00FC;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut f&#x00FC;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leticia Maria","family":"Bolzani P\u00f6hls","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut f&#x00FC;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2761740"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2019.2922889"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2021.3092533"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-022-04992-8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/DATE58400.2024.10546709"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2022.3202517"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2019.05.004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2022.3182133"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3244509"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETS61313.2024.10567697"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2985013"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS59952.2024.10595966"},{"key":"ref13","first-page":"1","article-title":"Re2fresh: A framework for mitigating read disturbance in reram-based dnn accelerators","volume-title":"2022 IEEE\/ACM International Conference On Computer Aided Design (IC-CAD)","author":"Shin","year":"2022"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2022.3148967"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/2634-4386\/ac6d04"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFT56152.2022.9962345"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10060645"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2931769"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993491"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1038.\/s41586-020-1942-4"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2025.115630"},{"key":"ref22","author":"Simonyan","year":"2015","journal-title":"Very deep convolutional networks for large-scale image recognition"},{"key":"ref23","article-title":"Learning multiple layers of features from tiny images","author":"Krizhevsky","year":"2009","journal-title":"tech. rep., University of Toronto"},{"key":"ref24","first-page":"854","article-title":"Technology-design co-optimization of resistive cross-point array for accelerating learning algorithms on chip","volume-title":"2015 Design, Automation Test in Europe Conference Exhibition (DATE)","author":"Chen","year":"2015"}],"event":{"name":"2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS)","location":"Ischia, Italy","start":{"date-parts":[[2025,7,7]]},"end":{"date-parts":[[2025,7,9]]}},"container-title":["2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11115077\/11116814\/11117065.pdf?arnumber=11117065","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T06:50:22Z","timestamp":1755672622000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11117065\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,7]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/iolts65288.2025.11117065","relation":{},"subject":[],"published":{"date-parts":[[2025,7,7]]}}}