{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,24]],"date-time":"2026-06-24T20:32:03Z","timestamp":1782333123595,"version":"3.54.5"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112669","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T19:32:57Z","timestamp":1433359977000},"page":"2A.2.1-2A.2.11","source":"Crossref","is-referenced-by-count":10,"title":["A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL\/MOL\/FEOL)"],"prefix":"10.1109","author":[{"given":"Ernest","family":"Wu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"James","family":"Stathis","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Baozhen","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Barry","family":"Linder","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kai","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Griselda","family":"Bonilla","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","year":"2013","journal-title":"Appl Phys Lett v 103 152907"},{"key":"ref11","first-page":"866","year":"1995","journal-title":"International Electron Device Meeting"},{"key":"ref12","first-page":"904","year":"1999","journal-title":"J Appl Phys 86"},{"key":"ref13","first-page":"296","year":"2001","journal-title":"IEEE Electron Device Letters v 22"},{"key":"ref14","year":"2004","journal-title":"Microelectron Engineering v 72 p24"},{"key":"ref15","first-page":"217","year":"2007","journal-title":"International Reliability Physics Symposium"},{"key":"ref16","first-page":"1925","year":"2007","journal-title":"Microelectronic Engineering 84"},{"key":"ref17","first-page":"262","year":"2008","journal-title":"International Reliability Physics Symposium"},{"key":"ref18","first-page":"840","year":"2014","journal-title":"International Electron Device Meeting"},{"key":"ref19","first-page":"513","year":"2007","journal-title":"Microelctronics Reliability v 47"},{"key":"ref4","first-page":"278","year":"2011","journal-title":"IEEE Tran On Deivce and Material Reliability v 11"},{"key":"ref3","first-page":"649","year":"2012","journal-title":"International Electron Device Meeting"},{"key":"ref6","first-page":"149","year":"2011","journal-title":"International Reliability Physics Symposium"},{"key":"ref5","first-page":"307","year":"2010","journal-title":"IEEE Tran On Deivce and Material Reliability v 11"},{"key":"ref8","first-page":"2301","year":"2000","journal-title":"IEEE Trans Electron Devices 47"},{"key":"ref7","year":"1976","journal-title":"Applied Life Data Analysis"},{"key":"ref2","first-page":"3a.1","year":"2014","journal-title":"International Reliability Physics Symposium"},{"key":"ref1","first-page":"29","year":"2003","journal-title":"International Reliability Physics Symposium"},{"key":"ref9","first-page":"2141","year":"2002","journal-title":"IEEE Tran On Electron Devices v 49"},{"key":"ref20","first-page":"1442","year":"2009","journal-title":"IEEE Trans Electron Devices 56"},{"key":"ref22","first-page":"5b.2.1","year":"2014","journal-title":"International Reliability Physics Symposium"},{"key":"ref21","first-page":"228","year":"2009","journal-title":"International Interconnect Technology Conference"},{"key":"ref24","first-page":"401","year":"2013","journal-title":"International Electron Device Meeting"},{"key":"ref23","first-page":"219","year":"2014","journal-title":"International Interconnect Technology Conference"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2015,4,19]]},"end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112669.pdf?arnumber=7112669","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:25:29Z","timestamp":1490383529000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112669\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112669","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}