{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T00:59:58Z","timestamp":1729645198305,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112671","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"2A.4.1-2A.4.5","source":"Crossref","is-referenced-by-count":5,"title":["Intrinsic mechanism of non-linearity in Weibull TDDB lifetime and its impact on lifetime prediction"],"prefix":"10.1109","author":[{"given":"Kenji","family":"Okada","sequence":"first","affiliation":[]},{"given":"Kazumi","family":"Kurimoto","sequence":"additional","affiliation":[]},{"given":"Mitsuhiro","family":"Suzuki","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251215"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.1999.799338"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1995.499353"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724635"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1985.21957"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"2301","DOI":"10.1109\/16.887012","article-title":"Weibull breakdown characteristics and oxide thickness uniformity","volume":"47","author":"wu","year":"2000","journal-title":"IEEE Trans Elec Dev"},{"key":"ref12","first-page":"47","article-title":"A Unified Gate Oxide Reliability Model","author":"hu","year":"1999","journal-title":"Proceedings of International Reliability Physics Symposium"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860662"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2014.6894386"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/16.535341"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.368217"},{"key":"ref1","first-page":"565","article-title":"New Experimental Findings on Stress Induced Leakage Current of Ultra Thin Silicon Dioxides","author":"okada","year":"1994","journal-title":"Extended Abstracts SSDM"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112671.pdf?arnumber=7112671","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T08:55:02Z","timestamp":1498208102000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112671\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112671","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}