{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:55:43Z","timestamp":1725540943129},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112675","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T19:32:57Z","timestamp":1433359977000},"page":"2B.4.1-2B.4.7","source":"Crossref","is-referenced-by-count":2,"title":["Time-integrated photon emission as a function of temperature in 32 nm CMOS"],"prefix":"10.1109","author":[{"given":"Andrea Bahgat","family":"Shehata","sequence":"first","affiliation":[]},{"given":"Alan J.","family":"Weger","sequence":"additional","affiliation":[]},{"given":"Franco","family":"Stellari","sequence":"additional","affiliation":[]},{"given":"Peilin","family":"Song","sequence":"additional","affiliation":[]},{"given":"Herve","family":"Deslandes","sequence":"additional","affiliation":[]},{"given":"Ted","family":"Lundquist","sequence":"additional","affiliation":[]},{"given":"Euan","family":"Ramsay","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"117","article-title":"MARVEL - Malicious Alteration Recognitionn and Verification by Emission of Light","author":"song","year":"2011","journal-title":"Host"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2001.912636"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860639"},{"key":"ref6","first-page":"471","article-title":"Application of infrared emission microscope for flip-chip (C4) failure analysis","author":"seidel","year":"1999","journal-title":"ISTFA"},{"key":"ref11","first-page":"128","article-title":"Near-infrared photon emission spectroscopy trends in scaled SOI technologies","author":"kindereit","year":"2012","journal-title":"ISTFA"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.118305"},{"key":"ref8","first-page":"6","article-title":"Novel NIR camera with extended sensitivity and low noise for photon emission microscopy of VLSI circuits","author":"shehata","year":"2014","journal-title":"ISTFA"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(03)00291-9"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.07.031"},{"key":"ref9","first-page":"415","article-title":"Ultra-low voltage Time-Resolved Emission measurements from 32 nm SOI CMOS integrated circuits","author":"shehata","year":"2014","journal-title":"ISTFA"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.833967"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112675.pdf?arnumber=7112675","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:26:15Z","timestamp":1490383575000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112675\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112675","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}