{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,27]],"date-time":"2026-05-27T18:17:12Z","timestamp":1779905832735,"version":"3.53.1"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112677","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"2C.2.1-2C.2.5","source":"Crossref","is-referenced-by-count":6,"title":["Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs"],"prefix":"10.1109","author":[{"given":"Gilles","family":"Gasiot","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dimitri","family":"Soussan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jean-Luc","family":"Autran","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Victor","family":"Malherbe","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Philippe","family":"Roche","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-77960-2_36"},{"key":"ref11","year":"0","journal-title":"Laboratoire Léon Brillouin"},{"key":"ref12","year":"2006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1667\/RR1094.1"},{"key":"ref14","year":"0","journal-title":"EXcel-Based Program for Calculating Atmospheric Cosmic-Ray Spectrum"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2179945"},{"key":"ref16","article-title":"Effects of Low Energy Muons on Electronics: Physical Insights and Geant4 Simulation","author":"serre","year":"0","journal-title":"Proceedings of the RADECS 2012"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2010.5706480"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2002.1175845"},{"key":"ref6","article-title":"Effects of Low Energy Muons on Electronics: Physical Insights and Geant4 Simulation","author":"serre","year":"0","journal-title":"Proceedings of the RADECS 2012"},{"key":"ref5","article-title":"Advanced CMOS Bulk, FinFET and UTBB SOI Technologies","author":"roche","year":"2014","journal-title":"IEEE nuclear and space radiation effects conference short course section III"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2014.7004577"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861178"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2080689"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784484"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2003.1281368"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2015,4,19]]},"end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112677.pdf?arnumber=7112677","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:29:06Z","timestamp":1490369346000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112677\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112677","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}