{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:00:45Z","timestamp":1725433245899},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112689","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"2E.5.1-2E.5.8","source":"Crossref","is-referenced-by-count":0,"title":["Trapping characteristics and parametric shifts in lateral GaN HEMTs with SiO<inf>2<\/inf>\/AlGaN gate stacks"],"prefix":"10.1109","author":[{"given":"M. P.","family":"King","sequence":"first","affiliation":[]},{"given":"J. R.","family":"Dickerson","sequence":"additional","affiliation":[]},{"given":"S.","family":"DasGupta","sequence":"additional","affiliation":[]},{"given":"M. J.","family":"Marinella","sequence":"additional","affiliation":[]},{"given":"R. J.","family":"Kaplar","sequence":"additional","affiliation":[]},{"given":"D.","family":"Piedra","sequence":"additional","affiliation":[]},{"given":"M.","family":"Sun","sequence":"additional","affiliation":[]},{"given":"T.","family":"Palacios","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.1149581"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1794897"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1021\/bi00504a006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0006-3495(02)75570-7"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/ppsc.19960130507"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1137\/1034115"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1137\/0916069"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/279232.279236"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860588"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.353777"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2087339"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2012.09.010"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-015-8480-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0010-4655(82)90173-4"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2303853"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.82.245318"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2198652"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4772503"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0006-3495(76)85660-3"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112689.pdf?arnumber=7112689","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:10:35Z","timestamp":1490368235000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112689\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112689","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}