{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T20:46:17Z","timestamp":1780605977547,"version":"3.54.1"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112693","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T19:32:57Z","timestamp":1433359977000},"page":"2F.3.1-2F.3.5","source":"Crossref","is-referenced-by-count":27,"title":["Systematical study of 14nm FinFET reliability: From device level stress to product HTOL"],"prefix":"10.1109","author":[{"given":"Changze","family":"Liu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyun-Chul","family":"Sagong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyejin","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seungjin","family":"Choo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyunwoo","family":"Lee","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yoohwan","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyunjin","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bisung","family":"Jo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Minjung","family":"Jin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jinjoo","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sangsu","family":"Ha","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sangwoo","family":"Pae","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jongwoo","family":"Park","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","first-page":"6a.6","article-title":"Correlation of BTI induced device parameter degadation and variation in scaled Metal Gate \/ High-k CMOS technologies","author":"kerber","year":"0","journal-title":"IEEE IRPS 2014"},{"key":"ref3","first-page":"6a.5","article-title":"Bias temperature instability variation on SiON\/Poly, HK\/MG and trigate architechtures","author":"prasad","year":"0","journal-title":"IEEE IRPS 2014"},{"key":"ref6","first-page":"232","article-title":"A 14nm FinFET 128Mb 6T SRAM with Vmin Enhancement Techniques for Low-Power Applications","author":"song","year":"0","journal-title":"2014 IEEE ISSCC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.2002351"},{"key":"ref2","first-page":"2d.1","article-title":"Technology Scaling on High-K & Metal-Gate FinFET BTI Reliablity","author":"lee","year":"0","journal-title":"IEEEIRPS 2013"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2012.6242496"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","location":"Monterey, CA, USA","start":{"date-parts":[[2015,4,19]]},"end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112693.pdf?arnumber=7112693","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:46:02Z","timestamp":1490388362000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112693\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112693","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}