{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T14:17:59Z","timestamp":1725459479456},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112724","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"4A.2.1-4A.2.5","source":"Crossref","is-referenced-by-count":4,"title":["Delay effects and frequency dependence of NBTI with sub-microsecond measurements"],"prefix":"10.1109","author":[{"given":"Y.-C.","family":"Huang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.-H.","family":"Hsieh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.-Y.","family":"Yew","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Maji","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.-H.","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.-S.","family":"Chou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.-Z.","family":"Kang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424236"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861104"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.2003224"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2020308"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532006"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2015160"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2026389"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2012.6467653"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.840856"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2225624"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.02.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2006.883565"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1149\/1.2728799"},{"key":"ref8","first-page":"26","article-title":"A Unified Model for Permanent and Recoverable NBTI Based on Hole Trapping and Structural Relaxation","author":"ielmini","year":"2009","journal-title":"IEEE International Reliability Physics Symposium"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860643"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861181"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2014.7049507"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861100"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2003.12.025"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112724.pdf?arnumber=7112724","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:14:18Z","timestamp":1490368458000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112724\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112724","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}