{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T10:58:48Z","timestamp":1725447528619},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112729","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T19:32:57Z","timestamp":1433359977000},"page":"4B.2.1-4B.2.4","source":"Crossref","is-referenced-by-count":4,"title":["SOI FinFET soft error upset susceptibility and analysis"],"prefix":"10.1109","author":[{"given":"P.","family":"Oldiges","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K. P.","family":"Rodbell","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Gordon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. G.","family":"Massey","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Stawiasz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Murray","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Tang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K. P.","family":"Muller","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"291","author":"buturla","year":"1989","journal-title":"NASECODE VI"},{"key":"ref3","first-page":"551","author":"fang","year":"2011","journal-title":"IEEE TDMR"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0265"},{"key":"ref6","first-page":"2575","author":"oldiges","year":"2000","journal-title":"IEEE TNS"},{"journal-title":"paper 9 3 ISSCC","year":"2010","author":"warnock","key":"ref11"},{"key":"ref5","first-page":"129","author":"leong","year":"1998","journal-title":"SISPAD '98 Tech Dig"},{"journal-title":"SIA ITAR Cat XVd Tech Pub","year":"2012","author":"baumann","key":"ref12"},{"journal-title":"IEDM Tech Dig paper 3 8","year":"2014","author":"lin","key":"ref8"},{"journal-title":"Proc GOMACTech paper 5 5","year":"2014","author":"rodbell","key":"ref7"},{"key":"ref2","first-page":"2666","author":"seifert","year":"2012","journal-title":"IEEE TNS"},{"key":"ref9","first-page":"3512","author":"heidel","year":"2006","journal-title":"IEEE TNS"},{"key":"ref1","first-page":"300","author":"cannon","year":"2004","journal-title":"Proc IRPS"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112729.pdf?arnumber=7112729","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:03:31Z","timestamp":1490382211000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112729\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112729","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}