{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,12]],"date-time":"2025-06-12T04:47:18Z","timestamp":1749703638553,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112746","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"5B.5.1-5B.5.6","source":"Crossref","is-referenced-by-count":17,"title":["A microscopic physical description of RTN current fluctuations in HfO<inf>x<\/inf> RRAM"],"prefix":"10.1109","author":[{"given":"Francesco Maria","family":"Puglisi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo","family":"Pavan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luca","family":"Vandelli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrea","family":"Padovani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matteo","family":"Bertocchi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luca","family":"Larcher","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM","author":"puglisi","year":"2013","journal-title":"Proc of IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC)"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"24","DOI":"10.37936\/ecti-eec.2014121.170814","article-title":"Factorial Hidden Markov Model analysis of Random Telegraph Noise in Resistive Random Access Memories","volume":"12","author":"puglisi","year":"2014","journal-title":"ECTI Transactions on Electrical Engineering Electronics and communications"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2305972"},{"year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2158825"},{"key":"ref15","first-page":"my.5.1","article-title":"Instability of HfO2 RRAM devices: Comparing RTN and cycling variability","author":"puglisi","year":"2014","journal-title":"Proceedings of the IEEE International Reliability Physics Symposium (IRPS)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2013.03.010"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1149\/06414.0049ecst"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2238883"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.4800528"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861146"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173283"},{"key":"ref6","first-page":"1069","article-title":"A multi-probe correlated bulk defect characterization scheme for ultra-thin high-? dielectric","author":"masuduzzaman","year":"2010","journal-title":"Proceedings of the IEEE International Reliability Physics Symposium (IRPS)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532101"},{"key":"ref7","first-page":"164t","article-title":"RTN insight to filamentary instability and disturb immunity in ultra-low power switching HfOx and AlOx RRAM","author":"raghavan","year":"2013","journal-title":"Proc VLSI Technol (VLSIT) Symp"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531959"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2268246"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2329020"},{"key":"ref20","article-title":"Spectroscopic properties of oxygen vacancies in monoclinic HfO2 calculated with periodic and embedded cluster density functional theory","volume":"75","author":"ramo","year":"2007","journal-title":"Phys Rev B"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2012.6343386"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.65.599"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.65.174117"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2013.02.023"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112746.pdf?arnumber=7112746","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,10]],"date-time":"2023-08-10T23:05:16Z","timestamp":1691708716000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112746\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112746","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}