{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,2]],"date-time":"2025-06-02T17:31:51Z","timestamp":1748885511163,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112761","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"6B.1.1-6B.1.5","source":"Crossref","is-referenced-by-count":4,"title":["28nm UTBB FDSOI product reliability\/performance trade-off optimization through body bias operation"],"prefix":"10.1109","author":[{"given":"P.","family":"Mora","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"X.","family":"Federspiel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Cacho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Huard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.","family":"Arfaoui","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Transaction on Electron Device","year":"2011","key":"ref10"},{"journal-title":"IRPS","year":"2014","key":"ref11"},{"journal-title":"IRPS","year":"2014","key":"ref12"},{"journal-title":"DATE","year":"2013","key":"ref13"},{"journal-title":"IRPS","year":"2014","key":"ref14"},{"volume":"61","journal-title":"ECS Transaction","year":"2014","key":"ref4"},{"journal-title":"IEEE IIRW 2012","year":"0","key":"ref3"},{"volume":"55","journal-title":"Transaction on Electron Device","year":"2008","key":"ref6"},{"journal-title":"IRPS","year":"2012","key":"ref5"},{"journal-title":"IRPS","year":"2012","key":"ref8"},{"journal-title":"IRPS","year":"2007","key":"ref7"},{"journal-title":"VLSI","year":"2012","key":"ref2"},{"journal-title":"IEDM","year":"2012","key":"ref1"},{"journal-title":"SOI Conf","year":"2004","key":"ref9"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112761.pdf?arnumber=7112761","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:07:24Z","timestamp":1490368044000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112761\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112761","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}