{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T21:04:51Z","timestamp":1725397491171},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112795","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"EL.4.1-EL.4.3","source":"Crossref","is-referenced-by-count":1,"title":["A novel high level ESD FDNSCR with drain side engineering in PMIC application"],"prefix":"10.1109","author":[{"given":"Yi-Ning","family":"He","sequence":"first","affiliation":[]},{"given":"Jhih-Ming","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Tien-Hao","family":"Tang","sequence":"additional","affiliation":[]},{"given":"Kuan-Cheng","family":"Su","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"Transmission Line Pulsing techniques for Circuit Modeling of ESD Phenomena","author":"maloney","year":"1985","journal-title":"Proc of the EOS\/ESD Symposium"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531947"},{"key":"ref6","article-title":"Transient Analysis of ESD Protection Elements by Time Domain Transmission Using Repetitive Pulses","author":"wolf","year":"2006","journal-title":"Proc of the EOS\/ESD Symposium"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/INEC.2008.4585559"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2009.5418608"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.2007.4401775"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2003.815192"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2010.5532309"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.894823"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112795.pdf?arnumber=7112795","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:26:10Z","timestamp":1490369170000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112795\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112795","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}