{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:52:34Z","timestamp":1730271154859,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112798","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"ER.1.1-ER.1.7","source":"Crossref","is-referenced-by-count":1,"title":["Understanding the underlying degradation physics for proper time-to-failure distribution selection"],"prefix":"10.1109","author":[{"given":"J. W.","family":"McPherson","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1177\/0021998307082175"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.biomaterials.2009.06.040"},{"key":"ref12","article-title":"Estimating the Time-to-Failure Distribution of a Linear Degradation Model Using a Bayesian Approach","volume":"3","author":"ebrahem","year":"2009","journal-title":"Applied Mathematical Sciences"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6348-2"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-8176-4924-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.5301\/ejo.5000114"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.3678041"},{"journal-title":"Defects in Microelectronic Materials and Devices","year":"2009","author":"fleetwood","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/9780470455265"},{"key":"ref19","article-title":"Accelerated Testing: Statistical Models","author":"nelson","year":"1990","journal-title":"Test Plans and Data Analyses"},{"key":"ref4","article-title":"A Comparison of Degradation and Failure-Time Analysis Methods for Estimating a Time-To-Failure Distribution","volume":"6","author":"lu","year":"1996","journal-title":"Statistica Sinica"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/55.79562"},{"key":"ref6","article-title":"Hot Carrier Degradation in Novel Strained Si n-MOSFETs","volume":"18","author":"lu","year":"2004","journal-title":"IEEE International Reliability Physics Symposium Proceedings"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1997.584280"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/07408170590929009"},{"key":"ref7","article-title":"A Comprehensive Model of PMOS Negative Bias Temperature Degradation","volume":"71","author":"alam","year":"2005","journal-title":"Microelectronics Reliability"},{"key":"ref2","volume":"16","author":"attewell","year":"1990","journal-title":"Time-dependent atmospheric degradation of building stone in a polluting environment"},{"key":"ref1","article-title":"Hot-Carrier Current Modeling and Device Degradation in Surface Channel PMOSFET","volume":"ed 37","author":"ong","year":"1990","journal-title":"IEEE Trans on Electron Devices"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.08.001"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.06.007"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0129-1564(01)00100-3"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/16.662800"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2002.996654"},{"key":"ref23","article-title":"A Model for Stress-Induced Metal Notching and Voiding in VLSI Al-Si Metallization","volume":"1321","author":"mcpherson","year":"1987","journal-title":"J Vac Sci Technol B"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112798.pdf?arnumber=7112798","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:29:14Z","timestamp":1490369354000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112798\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112798","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}