{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:52:37Z","timestamp":1730271157220,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112807","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"MY.1.1-MY.1.5","source":"Crossref","is-referenced-by-count":0,"title":["Analysis of the SET and RESET states drift of phase-change memories by low frequency noise measurements"],"prefix":"10.1109","author":[{"given":"S.","family":"Souiki-Figuigui","sequence":"first","affiliation":[]},{"given":"V.","family":"Sousa","sequence":"additional","affiliation":[]},{"given":"G.","family":"Ghibaudo","sequence":"additional","affiliation":[]},{"given":"G.","family":"Navarro","sequence":"additional","affiliation":[]},{"given":"M.","family":"Coue","sequence":"additional","affiliation":[]},{"given":"L.","family":"Perniola","sequence":"additional","affiliation":[]},{"given":"P.","family":"Zuliani","sequence":"additional","affiliation":[]},{"given":"R.","family":"Annunziata","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"21.5.1","author":"navarro","year":"2013","journal-title":"IEDM"},{"key":"ref3","volume":"54506","author":"betti beneventi","year":"2009","journal-title":"JAP"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2178245"},{"key":"ref6","first-page":"351","author":"papandreaou","year":"2011","journal-title":"IEDM"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2310497"},{"key":"ref8","volume":"54517","author":"ielmini","year":"2007","journal-title":"JAP"},{"volume":"4","journal-title":"IEDM","year":"2008","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2313889"},{"key":"ref9","first-page":"939","author":"ielmini","year":"2007","journal-title":"IEDM"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2285403"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112807.pdf?arnumber=7112807","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T17:00:42Z","timestamp":1490374842000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112807\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112807","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}