{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T08:11:27Z","timestamp":1725437487795},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112828","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"SE.9.1-SE.9.4","source":"Crossref","is-referenced-by-count":1,"title":["Impact of package on neutron induced single event upset in 20 nm SRAM"],"prefix":"10.1109","author":[{"given":"Taiki","family":"Uemura","sequence":"first","affiliation":[]},{"given":"Takashi","family":"Kato","sequence":"additional","affiliation":[]},{"given":"Hideya","family":"Matsuyama","sequence":"additional","affiliation":[]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2291274"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2187215"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241928"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/00223131.2013.814553"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2014.6931634"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2364953"},{"key":"ref1","first-page":"1","article-title":"Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Error in Semiconductor Devices: JESD89A","year":"2006","journal-title":"JEDEC Solid State Technol Assoc"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112828.pdf?arnumber=7112828","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:26:26Z","timestamp":1490369186000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112828\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112828","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}