{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T14:45:41Z","timestamp":1725461141814},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112831","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T19:32:57Z","timestamp":1433359977000},"page":"SE.2.1-SE.2.6","source":"Crossref","is-referenced-by-count":6,"title":["MBU-Calc: A compact model for Multi-Bit Upset (MBU) SER estimation"],"prefix":"10.1109","author":[{"given":"Wei","family":"Wu","sequence":"first","affiliation":[]},{"given":"Norbert","family":"Seifert","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/RELPHY.2008.4558882"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TNS.2012.2218128"},{"key":"ref6","article-title":"Cell Level Soft Error Rate Simulations on Planar and FinFET Processes","author":"fang","year":"0","journal-title":"2015 CPMT SER Workshop"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/24.52622"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1561\/1000000018"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TDMR.2005.853449"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112831.pdf?arnumber=7112831","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:29:15Z","timestamp":1490383755000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112831\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112831","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}