{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:59:37Z","timestamp":1729630777807,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/irps.2015.7112834","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:32:57Z","timestamp":1433345577000},"page":"XT.2.1-XT.2.6","source":"Crossref","is-referenced-by-count":1,"title":["Hot-carrier degradation in single-layer double-gated graphene field-effect transistors"],"prefix":"10.1109","author":[{"given":"Yu. Yu.","family":"Illarionov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Waltl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.D.","family":"Smith","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Vaziri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Ostling","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Mueller","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.C.","family":"Lemme","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Grasser","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1063\/1.4897344"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1149\/1.3572292"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TDMR.2012.2190414"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1063\/1.4897344"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/IEDM.2011.6131624"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"480","DOI":"10.1109\/LED.2012.2185033","article-title":"Defect Loss: A New Concept for Reliability of MOSFETs","volume":"33","author":"groeseneken","year":"2012","journal-title":"IEEE Electron Device Lett"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1063\/1.2779107"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.ssc.2007.02.043"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1166\/jnn.2013.7310"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"666","DOI":"10.1126\/science.1102896","article-title":"Electric Fielld Effect in Atomically Thin Carbon Films","author":"novoselov","year":"2004","journal-title":"Science"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.sse.2013.02.008"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/LED.2011.2131113"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/LED.2007.891668"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1049\/mnl.2009.0052"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1038\/ncomms1911"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1063\/1.3483130"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1038\/nmat1849"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TED.2013.2267541"}],"event":{"name":"2015 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2015,4,19]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2015,4,23]]}},"container-title":["2015 IEEE International Reliability Physics Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7106273\/7112653\/07112834.pdf?arnumber=7112834","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T08:55:06Z","timestamp":1498208106000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7112834\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/irps.2015.7112834","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}