{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T13:40:04Z","timestamp":1725716404498},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353565","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T21:16:55Z","timestamp":1525814215000},"page":"3C.6-1-3C.6-8","source":"Crossref","is-referenced-by-count":6,"title":["Machine-learned assessment and prediction of robust solid state storage system reliability physics"],"prefix":"10.1109","author":[{"given":"Jay","family":"Sarkar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cory","family":"Peterson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amir","family":"Sanayei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"SSD Failures in Datacenters: What? When? And Why?","author":"narayanan","year":"2016","journal-title":"Proc 2016 9th ACM International Systems and Storage Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2735969"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2713127"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-7138-7"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2725738"},{"journal-title":"Solid State Drive (SSD) Requirements and Endurance Test Method - JESD218B 01 JEDEC Solid-State Technology Association","year":"2016","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2015.7105166"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RAM.2017.7889748"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"journal-title":"Solid State Drive (SSD) Endurance Workloads - JESD219A JEDEC Solid-State Technology Association","year":"2012","key":"ref7"},{"key":"ref2","first-page":"280","article-title":"Bit Error Rates in NAND Flash memory","author":"mielke","year":"1987","journal-title":"Proc International Reliability Physics Symposium"},{"journal-title":"Nonvolatile Memory Technologies with Emphasis on Flash A Comprehensive Guide to Understanding and Using Flash Memory Devices","year":"2008","author":"brewer","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-63913-0"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2018,3,11]]},"location":"Burlingame, CA","end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353565.pdf?arnumber=8353565","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T18:55:51Z","timestamp":1527879351000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353565\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353565","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}