{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,6]],"date-time":"2025-10-06T18:44:15Z","timestamp":1759776255556},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353574","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T17:16:55Z","timestamp":1525799815000},"page":"4A.1-1-4A.1-6","source":"Crossref","is-referenced-by-count":9,"title":["Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics"],"prefix":"10.1109","author":[{"given":"A.","family":"Ranjan","sequence":"first","affiliation":[]},{"given":"N.","family":"Raghavan","sequence":"additional","affiliation":[]},{"given":"S.J.","family":"O'Shea","sequence":"additional","affiliation":[]},{"given":"S.","family":"Mei","sequence":"additional","affiliation":[]},{"given":"M.","family":"Bosman","sequence":"additional","affiliation":[]},{"given":"K.","family":"Shubhakar","sequence":"additional","affiliation":[]},{"given":"K.L.","family":"Pey","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2016.06.015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3695"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/nmat1134"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1667278"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.13.4607"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1021\/nl1022139"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/nl3002205"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b06425"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/nn506645q"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.4939131"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1063\/1.4824035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.carbon.2017.05.041"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946459"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3367\/UFNe.0184.201410c.1045"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/nn300989g"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2010.89"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.3483130"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2015.0259"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/nature12952"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.3492843"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1102896"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.7b10948"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.5022040"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-017-02297-3"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/05698196708972174"},{"key":"ref23","article-title":"Conductive atomic force microscope study of bipolar and thershold resistive switching in 2D hexagonal boron nitride films","author":"ranjan","year":"2017","journal-title":"Scientific Reports"},{"key":"ref26","first-page":"3c-5.1","article-title":"Nanoscale investigations of soft breakdown events in few layered flourinated graphene","author":"ranjan","year":"2017","journal-title":"IEEE International Reliability Physics Symposium (IRPS)"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.901091"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2018,3,11]]},"location":"Burlingame, CA","end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353574.pdf?arnumber=8353574","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T16:21:32Z","timestamp":1527870092000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353574\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353574","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}