{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:53:34Z","timestamp":1730271214091,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353595","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T17:16:55Z","timestamp":1525799815000},"page":"4E.3-1-4E.3-4","source":"Crossref","is-referenced-by-count":5,"title":["Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs"],"prefix":"10.1109","author":[{"given":"Bhawani","family":"Shankar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ankit","family":"Soni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sayak Dutta","family":"Gupta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mayank","family":"Shrivastava","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1143\/APEX.3.121004"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2002753"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936414"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.201600834"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2006.346799"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2105242"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2013.2257783"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2665163"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/ISPSD.2017.7988921"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"193501","DOI":"10.1063\/1.2372758","article-title":"and Hajime Okumura, “Improvement of Unipolar Power Device Performance Using a Polarization Junction","volume":"89","author":"akira","year":"2006","journal-title":"Appl Phys Lett"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.816549"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.826533"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2018,3,11]]},"location":"Burlingame, CA","end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353595.pdf?arnumber=8353595","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T14:55:47Z","timestamp":1527864947000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353595\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353595","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}