{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,10]],"date-time":"2025-06-10T05:24:56Z","timestamp":1749533096657,"version":"3.28.0"},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353599","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T21:16:55Z","timestamp":1525814215000},"page":"4F.3-1-4F.3-5","source":"Crossref","is-referenced-by-count":5,"title":["Electromigration characteristics of power grid like structures"],"prefix":"10.1109","author":[{"given":"Baozhen","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrew","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paul","family":"McLaughlin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Barry","family":"Linder","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cathryn","family":"Christiansen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","volume":"3f 2","author":"li","year":"2013","journal-title":"IRPS"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.3169265"},{"key":"ref5","volume":"5b 2","author":"lin","year":"2016","journal-title":"IRPS"},{"key":"ref2","first-page":"195","volume":"v44","author":"hau-riege","year":"0","journal-title":"Microelectronics Reliability"},{"key":"ref1","volume":"6b 5","author":"sukharev","year":"2017","journal-title":"IRPS"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2018,3,11]]},"location":"Burlingame, CA","end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353599.pdf?arnumber=8353599","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T18:55:44Z","timestamp":1527879344000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353599\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353599","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}