{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T06:55:22Z","timestamp":1725519322826},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353603","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T21:16:55Z","timestamp":1525814215000},"page":"5A.3-1-5A.3-7","source":"Crossref","is-referenced-by-count":0,"title":["Impact of slow and fast oxide traps on In<inf>0.53<\/inf>Ga<inf>0.47<\/inf>As device operation studied using CET maps"],"prefix":"10.1109","author":[{"given":"V.","family":"Putcha","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Franco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Vais","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.","family":"Kaczer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Sioncke","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Linten","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Groeseneken","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488857"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574648"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784542"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936422"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.4928332"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2014.6931567"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488858"},{"key":"ref17","article-title":"On the apparent non-Arrhenius temperature dependence of charge-trapping in IIIV\/high-k MOS stack","author":"putcha","year":"0","journal-title":"submitted to IEEE TED"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2284668"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2014.7049510"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861098"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2016.7573410"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.4921483"},{"key":"ref8","first-page":"447","author":"grasser","year":"2014","journal-title":"The Capture\/Emission Time Map Approach to the Bias Temperature Instability"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558858"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.4794846"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2013.2284376"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784502"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2018,3,11]]},"location":"Burlingame, CA","end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353603.pdf?arnumber=8353603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T18:55:37Z","timestamp":1527879337000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353603","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}