{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T19:05:46Z","timestamp":1777489546218,"version":"3.51.4"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353613","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T21:16:55Z","timestamp":1525814215000},"page":"5C.2-1-5C.2-6","source":"Crossref","is-referenced-by-count":5,"title":["All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits"],"prefix":"10.1109","author":[{"given":"Gyusung","family":"Park","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Minsu","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chris H.","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bongjin","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vijay","family":"Reddy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241798"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861104"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2211171"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2294323"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2700326"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838524"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2159635"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746271"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2519446"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2353798"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2160813"},{"key":"ref2","first-page":"268","article-title":"A 0.012mm2 3.1mW Bang-Bang Digital Fractional-N PLL with a Power-Supply-Noise Cancellation Technique and a Walking-One-Phase-Selection Fractional Frequency Divider","author":"liu","year":"2014","journal-title":"IEEE International Solid-State Circuits Conference (ISSCC)"},{"key":"ref1","first-page":"194c","article-title":"A 12GHz 210fs 6m W Digital PLL with Sub-sampling Binary Phase Detector and Voltage-Time Modulated DCO","author":"ru","year":"2013","journal-title":"IEEE Symposium on VLSI Circuits"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040125"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","location":"Burlingame, CA","start":{"date-parts":[[2018,3,11]]},"end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353613.pdf?arnumber=8353613","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T18:55:57Z","timestamp":1527879357000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353613\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353613","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}