{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T16:06:20Z","timestamp":1725552380914},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353617","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T21:16:55Z","timestamp":1525814215000},"page":"5C.6-1-5C.6-6","source":"Crossref","is-referenced-by-count":3,"title":["Investigation of speed sensors accuracy for process and aging compensation"],"prefix":"10.1109","author":[{"given":"R.","family":"Shah","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Cacho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Huard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Mhira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Arora","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Agarwal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Kumar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Balaraman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.","family":"Singh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Anghel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"Electronic design automation tool and method for optimizing the placement of process monitors in an integrated circuit","author":"tetelbaum","year":"2009","journal-title":"U S Patent 0 282 381"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2015.2389038"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2125994"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IVSW.2016.7566606"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/APCCAS.2014.7032887"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.070"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2282742"},{"key":"ref7","first-page":"112","article-title":"Tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance","author":"tschanz","year":"0","journal-title":"2009 Symposium on VLSI Circuits"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.982424"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2005.1469380"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2018,3,11]]},"location":"Burlingame, CA","end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353617.pdf?arnumber=8353617","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T18:55:44Z","timestamp":1527879344000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353617\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353617","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}