{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T01:59:33Z","timestamp":1725415173714},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353654","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T21:16:55Z","timestamp":1525814215000},"page":"P-CR.1-1-P-CR.1-4","source":"Crossref","is-referenced-by-count":1,"title":["Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET"],"prefix":"10.1109","author":[{"given":"Mitsuhiko","family":"Igarashi","sequence":"first","affiliation":[]},{"given":"Yuuki","family":"Uchida","sequence":"additional","affiliation":[]},{"given":"Yoshio","family":"Takazawa","sequence":"additional","affiliation":[]},{"given":"Yasumasa","family":"Tsukamoto","sequence":"additional","affiliation":[]},{"given":"Koji","family":"Shibutani","sequence":"additional","affiliation":[]},{"given":"Koji","family":"Nii","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936315"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409679"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898082"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936416"},{"key":"ref1","article-title":"R-Car Gen3: Computing Platform for Autonomous Driving Era","author":"igarashi","year":"2017","journal-title":"Hot Chips 29 Symposium"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2018,3,11]]},"location":"Burlingame, CA","end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353654.pdf?arnumber=8353654","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T18:55:52Z","timestamp":1527879352000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353654\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353654","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}