{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,22]],"date-time":"2026-09-22T07:01:32Z","timestamp":1790060492240,"version":"4.0.1"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353661","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T21:16:55Z","timestamp":1525814215000},"page":"P-GD.1-1-P-GD.1-6","source":"Crossref","is-referenced-by-count":4,"title":["New insight on TDDB area scaling methodology of non-Poisson systems"],"prefix":"10.1109","author":[{"given":"Tian","family":"Shen","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kong Boon","family":"Yeap","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sean","family":"Ogden","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cathryn","family":"Christiansen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Patrick","family":"Justison","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860610"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2159120"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936359"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860662"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.09.017"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936361"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936327"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","location":"Burlingame, CA","start":{"date-parts":[[2018,3,11]]},"end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353661.pdf?arnumber=8353661","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T18:55:32Z","timestamp":1527879332000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353661\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353661","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}