{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T06:36:47Z","timestamp":1759991807840},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/irps.2018.8353707","type":"proceedings-article","created":{"date-parts":[[2018,5,8]],"date-time":"2018-05-08T17:16:55Z","timestamp":1525799815000},"page":"P-WB.4-1-P-WB.4-5","source":"Crossref","is-referenced-by-count":1,"title":["A novel GaN HEMT degradation mechanism observed during HTST test"],"prefix":"10.1109","author":[{"given":"F.","family":"Iucolano","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Parisi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Reina","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Chini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.4828839"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2271954"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2279021"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.201600764"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2300115"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/28\/7\/074021"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2029875"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.917815"}],"event":{"name":"2018 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2018,3,11]]},"location":"Burlingame, CA","end":{"date-parts":[[2018,3,15]]}},"container-title":["2018 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8345372\/8353529\/08353707.pdf?arnumber=8353707","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T14:55:33Z","timestamp":1527864933000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8353707\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/irps.2018.8353707","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}