{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:54:16Z","timestamp":1730271256511,"version":"3.28.0"},"reference-count":36,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720425","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-8","source":"Crossref","is-referenced-by-count":1,"title":["Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL\/FEOL Applications"],"prefix":"10.1109","author":[{"given":"Ernest Y.","family":"Wu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Baozhen","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"James H.","family":"Stathis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrew","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"crossref","DOI":"10.1109\/TED.2004.835986","volume":"51","author":"su\u00f1\u00e9","year":"2004","journal-title":"IEEE TED"},{"key":"ref32","first-page":"406","author":"alam","year":"2003","journal-title":"IRPS"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"224","DOI":"10.1109\/TED.2005.861597","volume":"53","author":"su\u00f1\u00e9","year":"2006","journal-title":"IEEE TED"},{"key":"ref30","first-page":"1","author":"larow","year":"2017","journal-title":"IIRW"},{"key":"ref36","first-page":"847","volume":"54","author":"raghavan","year":"2014","journal-title":"Microelectronic Engineering"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2011.03.012"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2055827"},{"key":"ref10","first-page":"120","volume":"9","year":"2009","journal-title":"IEEE TDMR"},{"key":"ref11","first-page":"278","volume":"11","author":"stucchi","year":"2011","journal-title":"IEEE TDMR"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4882116"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.4985794"},{"key":"ref14","first-page":"45","author":"monsieur","year":"2002","journal-title":"IRPS"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2002.805010"},{"key":"ref16","first-page":"2004","volume":"713","author":"kaczer","year":"0","journal-title":"IEDM"},{"key":"ref17","first-page":"1","volume":"6","author":"degraeve","year":"2001","journal-title":"IEDM"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"296","DOI":"10.1109\/55.924847","volume":"22","author":"su\u00f1\u00e9","year":"2001","journal-title":"IEEE EDL"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2002.805603"},{"key":"ref28","volume":"165","author":"chang","year":"2015","journal-title":"IEDM"},{"key":"ref4","volume":"1","author":"wu","year":"2017","journal-title":"IITC"},{"key":"ref27","volume":"299","author":"jeong","year":"2015","journal-title":"IITC"},{"key":"ref3","first-page":"3.a.2","author":"wu","year":"2016","journal-title":"IRPS"},{"key":"ref6","first-page":"3a.3","author":"wu","year":"2018","journal-title":"IRPS"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"90","DOI":"10.1016\/j.mee.2013.03.085","volume":"109","author":"chery","year":"2013","journal-title":"Micro Eng"},{"key":"ref5","first-page":"3.a.5","author":"kim","year":"2016","journal-title":"IRPS"},{"key":"ref8","volume":"54","author":"wu","year":"2016","journal-title":"IRPS"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"272","DOI":"10.1109\/LED.2003.812139","volume":"24","author":"su\u00f1\u00e9","year":"2003","journal-title":"IEEE EDL"},{"key":"ref2","volume":"7","author":"ong","year":"2018","journal-title":"IRPS GD"},{"key":"ref9","volume":"493","author":"wu","year":"2007","journal-title":"IEDM"},{"key":"ref1","first-page":"5b.1.1","volume":"60","author":"lee","year":"2017","journal-title":"IRPS"},{"key":"ref20","first-page":"2f.3.1","author":"barbarin","year":"2013","journal-title":"IRPS"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.4921949"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2874513"},{"journal-title":"MR","year":"2005","author":"wu","key":"ref24"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"2301","DOI":"10.1109\/16.848278","volume":"47","author":"wu","year":"2000","journal-title":"IEEE TED"},{"key":"ref26","first-page":"bd.4.1","author":"liniger","year":"2014","journal-title":"IRPS"},{"key":"ref25","first-page":"2f.4.1","author":"cores","year":"2013","journal-title":"IRPS"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720425.pdf?arnumber=8720425","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:13:12Z","timestamp":1657854792000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720425\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720425","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}