{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,15]],"date-time":"2025-12-15T18:45:05Z","timestamp":1765824305106,"version":"3.48.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720435","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T00:11:10Z","timestamp":1558656670000},"page":"1-4","source":"Crossref","is-referenced-by-count":7,"title":["Superior Endurance Performance of 22-nm Embedded MRAM Technology"],"prefix":"10.1109","author":[{"given":"V. B.","family":"Naik","sequence":"first","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. H.","family":"Lim","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Yamane","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Zeng","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Yang","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Thiyagarajah","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Kwon","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N. L.","family":"Chung","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Chao","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Ling","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Lee","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore, 738406"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510672"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614566"},{"key":"ref6","first-page":"65","article-title":"Demonstration of Ultra-Low Voltage and Ultra Low Power STT -MRAM designed for compatibility with Ox node embedded LLC applications","volume":"t06 4","author":"jan","year":"2018","journal-title":"IEEE Symposium on VLSI Technology"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510623"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353637"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.92.088302"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614620"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614515"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510655"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720435.pdf?arnumber=8720435","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,15]],"date-time":"2025-12-15T18:37:17Z","timestamp":1765823837000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720435\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720435","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}