{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T15:33:26Z","timestamp":1761060806190,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720447","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation"],"prefix":"10.1109","author":[{"given":"Tonmoy","family":"Dhar","sequence":"first","affiliation":[]},{"given":"Sachin S.","family":"Sapatnekar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"33","DOI":"10.1016\/j.microrel.2016.02.002","article-title":"Impact of NBTI induced variations on delay locked loop multi-phase clock generator","volume":"60","author":"sriram","year":"2016","journal-title":"Microelectron Reliab"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.08.013"},{"key":"ref10","first-page":"531","article-title":"Hot-carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature","author":"bravaix","year":"2009","journal-title":"Proc IRPS"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1996.542317"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2296499"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/4.910480"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.826820"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.5947"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2013.6815442"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"},{"key":"ref1","article-title":"Analog IC Reliability in Nanometer CMOS","author":"maricau","year":"2013","journal-title":"Analog Circuits and Signal Processing"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720447.pdf?arnumber=8720447","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:19:08Z","timestamp":1657855148000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720447\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720447","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}