{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T12:07:33Z","timestamp":1725797253983},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/irps.2019.8720451","type":"proceedings-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T04:11:10Z","timestamp":1558671070000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["On the Effect of NBTI Induced Aging of Power Stage on the Transient Performance of On-Chip Voltage Regulators"],"prefix":"10.1109","author":[{"given":"Venkata Chaitanya","family":"Krishna Chekuri","sequence":"first","affiliation":[]},{"given":"Arvind","family":"Singh","sequence":"additional","affiliation":[]},{"given":"Nihar","family":"Dasari","sequence":"additional","affiliation":[]},{"given":"Saibal","family":"Mukhopadhyay","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147172"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342116"},{"key":"ref6","doi-asserted-by":"crossref","DOI":"10.1109\/JSSC.2019.2945944","article-title":"A 128-bit AES Engine with Higher Resistance to Power & Electromagnetic Side-Channel Attacks Enabled by a Security-Aware Integrated All-Digital Low Dropout Regulator","author":"singh","year":"2019","journal-title":"Proc IEEE Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2017751"},{"key":"ref7","article-title":"Auto-tuning of Integrated Inductive Voltage Regulator Using On-Chip Delay Sensor to Tolerate Process and Passive Variations","author":"chekuri","year":"0","journal-title":"Unpublished under review at IEEE Trans VLSI Syst (TVLSI)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2013.2242471"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"}],"event":{"name":"2019 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2019,3,31]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,4]]}},"container-title":["2019 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8712125\/8720395\/08720451.pdf?arnumber=8720451","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:19:08Z","timestamp":1657855148000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720451\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps.2019.8720451","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}